Center Access and Training Information

(a) Instructions for ANY NEW USER

  • Regardless whether you plan to do the experiments yourself or the micorscopy will be performed by center staff: Go to FOM and create an account
  • Download the 'PI-signature form' from here let your supervisor fill in a valid SpeedType and sign.
  • Return the completed form to the center director.
  • Note: If your supervisor is listed on FOM we most likely already have a sigend 'PI-signature form'. Please check back with the center director.

(b) Additional Instructions for NEW USERS who want to be trained

  • Make sure you followed the steps above.
  • Apply for training for the insturment you want to use in FOM
  • Choose a date for the mandatory training session from below and inform the center director in advance which day you plan to attend.
  • Bring the completed 'PI-signature form' it to the Mandatory Training Session if you have not already done so.

(c) Mandatory Training Session

  • This training session is required for both grad students and post-docs.
  • The Madatory Training Session for both TEM ans SEM will be in Conte B121.
  • After attending the Mandatory Training Session proceed to Hands-On Training.
Brief introduction to Electron Microscopy and the general user policies of the Electron Microscopy Center.

2nd & 4th Friday 2pm~3:30pm Location: Conte B-121


(d) Hands on Training

  • Make sure to bring a notebook!
  • No personal samples are permitted unless you are instructed to bring one.
  • After having attended both Session 1 and Session 2 you will arrange for individual training with the center staff.

TEM JEOL 100CX

Location: Conte B-167

Session 1: 1st & 3rd Friday 2-4pm Session 2: 2nd & 4th Friday 2-4pm

TEM JEOL 2000FX

Location: Conte B-161

Session 1: 1st & 3rd Friday 10-12am Session 2: 2nd & 4th Friday 10-12am

SEM JEOL 6320 FESEM

Location: Conte B-166

Session 1: 1st & 3rd Thursday 2-4pm Session 2: 2nd & 4th Thursday 2-4pm


 

Note: Training for the Magellan 400 requires the ability to opperate the JEOL6320 FESEM independently.