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Copyright 2004 (c) Materials Research Science & Engineering, UMass - Amherst
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Manuals
Instructions and policy for instrument reservation (pdf : 30kb)
Basic operating instructions for:
6320 FESEM (pdf : 100kb)
JEOL 100CX TEM (pdf : 56kb)
JEOL 2000FX TEM (pdf : 52kb)
JEOL 3010 TEM (pdf : 132kb)
Microscope
Calibration
Magnification calibration
100CX TEM (pdf: 20kb)
2000FX TEM (pdf: 20kb)
Microscopy Links
Guide
to SEM observations from JEOL (pdf : 1.1mb)
TEM
tutorial based on "Transmission Electron Microscopy-Basics"
by D.B. Williams and C.B. Carter
Microscopy
Society of America
Electron
Microscopy supplies
On-line
software for diffraction analysis and image simulation
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