Scanning Electron Microscopes
- FEI-Magellan400 FESEM
- JEOL-6320FXV FESEM
- JEOL-5400JSM SEM
JEOL 6320FXV Field Emission Scanning Electron Microscope
High resolution field emission cold cathode scanning electron microscope with semi-in-lens detector configuration achieving resolution down to 2 nm.
It is equipped with BE (backscattered) detector and thin window energy dispersive X-ray spectrometer (EDS) from Princeton Gamma-Tech for compositional analysis, imaging and mapping.
Fully digital image acquisition.
