Scanning Electron Microscopes
- FEI-Magellan400 FESEM
- JEOL-6320FXV FESEM
- JEOL-5400JSM SEM
FEI Magellan 400 Field Emission Scanning Electron Microscope
The FEI Magellan 400 Field Emission Scanning Electron Microscope is capable of nanometer resolution even at extremely low acceleration voltages
enabling imaging of very beam sensitive materials.
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