• About
the Lab • People
/ Contact • Equipment
• Fees •
Instrument
Reservation • New
Users •
• Manuals
/ Links• Directions•
Copyright 2004 (c) Materials Research Science & Engineering, UMass - Amherst
This website has been tested with Mozilla
Firefox© and Internet
Explorer©
JEOL 6320FXV FESEM High resolution field emission cold cathode scanning electron microscope with semi-in-lens detector configuration achieving resolution down to 2 nm. It is equipped with BE (backscattered) detector and thin window energy dispersive X-ray spectrometer (EDS) from Princeton Gamma-Tech for compositional analysis, imaging and mapping. Fully digital image acquisition.
JEOL 35CF SEM Conventional scanning electron microscope (tungsten) for low to medium magnification work.
JEOL 3010 TEM 300kV LaB6 high resolution transmission electron microscope with point resolution of 2 Å. It is equipped with STEM unit, ultra thin window EDS detector from Princeton Gamma-Tech, Gatan imaging filter (GIF) which has both spectral and imaging capabilities. This microscope is suitable for high-resolution imaging, diffraction studies, compositional analysis and analysis of electronic structure and bonding.
JEOL 2000FX TEM 200kV transmission electron microscope with tungsten filament achieving resolution of 2.5 Å, equipped with STEM unit.
JEOL 100CX TEM 100kV conventional transmission electron microscope (tungsten) with STEM unit and point resolution of 3.4 Å.
Cryo holders are available
Sample preparation
equipment
·
Leica Ultracut and Leica EM FCS Cryo microtomes
· Gatan high resolution ion beam sputter coater
· Gold sputter coater
· Balzers evaporator
Equipment
| |
||||||||||||
| |
|
|||||||||||
| |
|
|||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
||||||||||||
| |
|
|
|
|
|
|
|
|
||||
| |
|
|
||||||||||
| |
||||||||||||
| |
|
|
||||||||||
| |
||||||||||||
| |
||||||||||||
| |
|
|
|
|
|
|
|
|
|
|
|
|