aeribbe's blog

Two presentation involving UMass Anherst EMC at the M&M 2015 in Portland

  • Posted on: 29 April 2015
  • By: aeribbe

8/5/2015 2 pm~
Thickness mapping of freestanding Ionic Liquid films using Electron Energy Loss Spectroscopy in the TEM
A E Ribbe, P Kim, D Hoagland, T Russell; University of Massachusetts Amherst

8/5/2015 2:30pm~
Focused Ne+ Ion Beams for Final Polishing of TEM Lamella Prepared Through Ga-FIB Systems
D Wei, C Huynh; Ion Microscopy Innovation Center, Carl Zeiss Microscopy, LLC; A Ribbe; University of
Massachusetts, Amherst